|
|
|
|
登录后可显示你上传的书籍、积分、金币等信息 |
|
|
|
|
Title:
Ultra-Low Voltage Nano-Scale Memories |
|
|
Division: Nano-related / Springer / 英文版 |
Author/Editor: Itoh, Kiyoo; Horiguchi, Masashi; Tanaka, Hitoshi Star:  |
|
ISBN: 0387333983 |
|
Introduce Date: 2008年03月28日19:39 , Release Date: 2008年03月28日19:49 |
|
Introducer: wzh12020915 , Rate: 1/111 |
| Format: pdf(editorial) Download |
|
|
| No comment is available! |
|
|
| Description: |
Ultra-Low Voltage Nano-Scale Memories
Series: Series on Integrated Circuits and Systems
Itoh, Kiyoo; Horiguchi, Masashi; Tanaka, Hitoshi (Eds.)
2007, XI, 346 p. 290 illus., Hardcover
ISBN: 978-0-387-33398-4
About this book
Authors share their vast knowledge and experience with practical examples
Discusses the emerging problems between the device, circuit, and system levels in terms of reliable high-speed operations of memory cells and peripheral logic circuits
Presents the essential differences in ultra-low voltage operations between DRAMs and SRAMs
Covers the basics to the state of the art
Ultra-Low Voltage Nano-Scale Memories provides an in-depth discussion of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically covered in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs. Moreover, various kinds of on-chip voltage converters necessary to solve problems with internal power-supply managements are extensively discussed. This authoritative monograph addresses these design challenges for memory and circuit engineers as well as for researchers and students who are interested in ultra-low voltage nano-scale memory LSIs.
Written for:
Circuit designers; practitioners, scientists, researchers
http://www.springer.com/engineer ... k/978-0-387-33398-4
|
|
|
